Generate, tune, and QC the tie between a synthetic seismogram and real seismic data. Interactive wavelet extraction, bulk-shift optimization, and cross-correlation scoring — all in a single stand-alone workflow.
The Synthetic Tie tool is available in two editions tailored to different use cases. Both share the same core tie engine.
The core well-to-seismic tie workflow. Load a LAS file and a seismic trace, generate a reflectivity series, convolve with a wavelet, and optimize the tie through bulk shift and wavelet tuning.
An enhanced edition with additional interactive controls, extended wavelet analysis, and a refined QC display — developed in collaboration with geophysicists focused on complex tie scenarios.
Every step of the synthetic tie is visible, adjustable, and documented. You control the wavelet, the shift, and the acceptance criteria — the tool doesn't decide for you.
Computes a reflectivity series from well-log impedance (P-impedance from Vp × RHOB), correctly handling depth-to-time conversion using the TD chart in the LAS file.
Choose a Ricker wavelet at any dominant frequency, extract a statistical wavelet from the seismic near the well, or design a custom wavelet. Interactive frequency control with live synthetic update.
Normalized cross-correlation between synthetic and real seismic, displayed as a function of time shift. The optimal bulk shift is identified automatically, but you can override it at any point.
Rotate wavelet phase from 0° to 360° and watch the synthetic update in real time. Quickly identify the phase that best matches the seismic data without manual trial-and-error.
Side-by-side and overlaid displays of the synthetic and real seismic trace — variable area, wiggle, or both. Zoom to any depth interval to inspect the tie in detail.
Export the finalized tie — synthetic trace, wavelet, bulk shift, cross-correlation coefficient — as a PDF report or ASCII/CSV for import into interpretation software.
Vp, RHOB, and TD chart from your LAS file
P-impedance = Vp × RHOB, depth to time
Reflection coefficients from impedance contrast
Reflectivity × wavelet = synthetic seismogram
Bulk shift + phase rotation to maximize cross-correlation
Tie report, final synthetic, and wavelet parameters
The tool is available now for qualified users. Contact us to discuss your use case and get set up with the edition that fits your workflow.
